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 SFP13N50 P13N50
Silicon N-Channel MOSFET
Features
13A,500V, RDS(on)(Max0.46)@VGS=10V Ultra-low Gate charge(Typical 43nC) Fast Switching Capability 100%Avalanche Tested Maximum Junction Temperature Range(150)
General Description
This Power MOSFET is produced using Winsemi's advancedplanar stripe,DMOS technology.This latest technology has beenespecially designed to minimize on-state resistance, have a high rugged avalanche characteristics .This devices is specially wellsuited for high efficiency switch model power supplies, power factor correction and half bridge and full bridge resonant topology line a electronic lamp ballast.
Absolute Maximum Ratings
Symbol
VDSS ID Continuous Drain Current(@Tc=100) IDM VGS EAS EAR dv/dt PD Derating Factor above 25 TJ,Tstg TL Junction and Storage Temperature Channel Temperature 1.56 -55~150 300 W/ Drain Current Pulsed Gate to Source Voltage Single Pulsed Avalanche Energy Repetitive Avalanche Energy Peak Diode Recovery dv /dt Total Power Dissipation(@Tc=25) (Note2) (Note1) (Note3) (Note1) 8 52 30 845 5 3.5 195 A A V mJ mJ V/ ns W Drain Source Voltage Continuous Drain Current(@Tc=25)
Parameter
Value
500 13
Units
V A
Thermal Characteristics
Symbol
RQJC RQCS RQJA
Parameter
Thermal Resistance , Junction -to -Case Thermal Resistance , Case-to-Sink Thermal Resistance , Junction-to -Ambient
Value Min
-
Typ
0.5 -
Max
0.64 62.5
Units
/W /W /W
Rev.A Oct.2010
Copyright@WinSemi Semiconductor Co., Ltd., All right reserved.
SFP13N50 SFP13 P13N50
Electrical Characteristics(Tc=25)
Characteristics
Gate leakage current Gate-source breakdown voltage
Symbol
IGSS V(BR)GSS
Test Condition
VGS=30V,VDS=0V IG=10 A,VDS=0V VDS=500V,VGS=0V
Min
30 -
Type
-
Max
100 1 10
Unit
nA V A A V V/ V S
Drain cut -off current
IDSS VDS=400V,TC=125
Drain -source breakdown voltage Breakdown voltage Temperature Coefficient Gate threshold voltage Drain -source ON resistance Forward Transconductance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Switching time Fall time Turn-off time Total gate charge(gate-source
V(BR)DSS BVDSS/ TJ VGS(th) RDS(ON) gfs Ciss Crss Coss tr ton tf toff Qg
ID=250 A,VGS=0V ID=250A,Referenced
500 -
0.5 0.37 15 1580 180 20 25 100 130 100 43 7.5 18.5
4.5 0.46 2055 235 25 60 210
to 25 VDS=10V,ID=250 A VGS=10V,ID=6.5A VDS=50V,ID=6.5A VDS=25V, VGS=0V, f=1MHz VDD=250V, ID=13A RG=9.1 RD=31 VDD=400V, VGS=10V, nC ID=13A (Note4,5) 56 (Note4,5) 3 -
pF
ns 270 210
plus gate-drain) Gate-source charge Gate-drain("miller") Charge Qgs Qgd
Source-Drain Ratings and Characteristics(Ta=25)
Characteristics
Continuous drain reverse current Pulse drain reverse current Forward voltage(diode) Reverse recovery time Reverse recovery charge
Symbol
IDR IDRP VDSF trr Qrr
Test Condition
IDR=13A,VGS=0V IDR=13A,VGS=0V, dIDR / dt =100 A / s
Min
-
Type
442 2.16
Max
13 52 1.4 633 3.24
Unit
A A V ns C
Note 1.Repeativity rating :pulse width limited by junction temperature 2.L=500uH IAS=13A,VDD=50V,RG=0,Starting TJ=25 3.ISD13A,di/dt300A/us,VDD2/7
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SFP13N50 SFP13 P13N50
Fig.1 On State Characteristics
Fig.2 Transfer Characteristics
Fig.3 Capacitance Variation vs Drain Voltage
Fig.4 Maximum Avalanche Energy vs On-State Current
Fig.5 On-Resistance Variation vs Junction temperature
Fig.6 Gate Charge Characteristics
3/7
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SFP13N50 SFP13 P13N50
Fig.7 Maximum Safe Operation Area
Fig.8 Maximum Drain Current vs Case temperature
Fig.9 Transient thermal Response Curve
4/7
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SFP13N50 SFP13 P13N50
Fig.10 Gate Test circuit & Waveform
Fig.11 Resistive Switching Test Circuit & Waveform
Fig.12 Unclamped Inductive Switching Test Circuit & Waveform
5/7
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SFP13N50 SFP13 P13N50
Fig.13 Peak Diode Recovery dv/dt Test Circuit & Waveform
6/7
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SFP13N50 SFP13 P13N50
TO-220 Package Dimension
Unit:mm
7/7
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